Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal. On test coverage of path delay faults. In 9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India. pages 418-421, IEEE Computer Society, 1996. [doi]
Abstract is missing.