Michael Majurski, Joe Chalfoun, Steven P. Lund, Peter Bajcsy, Mary Brady. Methodology for Increasing the Measurement Accuracy of Image Features. In 2016 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2016, Las Vegas, NV, USA, June 26 - July 1, 2016. pages 1399-1407, IEEE Computer Society, 2016. [doi]
Abstract is missing.