Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution - researchr publication authors

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Hiroshi Makino, Shunji Nakata, Hirotsugu Suzuki, Shin'ichiro Mutoh, Masayuki Miyama, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda. Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution. IEEE Trans. on Circuits and Systems, 58-II(4):230-234, 2011. [doi]

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