Hiroshi Makino, Shunji Nakata, Hirotsugu Suzuki, Shin'ichiro Mutoh, Masayuki Miyama, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda. Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution. IEEE Trans. on Circuits and Systems, 58-II(4):230-234, 2011. [doi]
@article{MakinoNSMMYIM11,
title = {Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution},
author = {Hiroshi Makino and Shunji Nakata and Hirotsugu Suzuki and Shin'ichiro Mutoh and Masayuki Miyama and Tsutomu Yoshimura and Shuhei Iwade and Yoshio Matsuda},
year = {2011},
doi = {10.1109/TCSII.2011.2124531},
url = {http://dx.doi.org/10.1109/TCSII.2011.2124531},
researchr = {https://researchr.org/publication/MakinoNSMMYIM11},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {58-II},
number = {4},
pages = {230-234},
}