Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets - researchr publication authors

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S. Makovejev, B. Kazemi Esfeh, Jean-Pierre Raskin, Denis Flandre, Valeria Kilchytska, François Andrieu. Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 194-197, IEEE, 2013. [doi]

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