S. Makovejev, B. Kazemi Esfeh, Jean-Pierre Raskin, Denis Flandre, Valeria Kilchytska, François Andrieu. Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 194-197, IEEE, 2013. [doi]
@inproceedings{MakovejevERFKA13,
title = {Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets},
author = {S. Makovejev and B. Kazemi Esfeh and Jean-Pierre Raskin and Denis Flandre and Valeria Kilchytska and François Andrieu},
year = {2013},
doi = {10.1109/ESSDERC.2013.6818852},
url = {http://dx.doi.org/10.1109/ESSDERC.2013.6818852},
researchr = {https://researchr.org/publication/MakovejevERFKA13},
cites = {0},
citedby = {0},
pages = {194-197},
booktitle = {Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013},
publisher = {IEEE},
}