Invariance-Based On-Line Test for RTL Controller-Datapath Circuits - researchr publication authors

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Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu. Invariance-Based On-Line Test for RTL Controller-Datapath Circuits. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 459-464, IEEE Computer Society, 2000. [doi]

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