Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu. Invariance-Based On-Line Test for RTL Controller-Datapath Circuits. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 459-464, IEEE Computer Society, 2000. [doi]
@inproceedings{MakrisBO00,
title = {Invariance-Based On-Line Test for RTL Controller-Datapath Circuits},
author = {Yiorgos Makris and Ismet Bayraktaroglu and Alex Orailoglu},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/vts/2000/0613/00/06130459abs.htm},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/MakrisBO00},
cites = {0},
citedby = {0},
pages = {459-464},
booktitle = {18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada},
publisher = {IEEE Computer Society},
isbn = {0-7695-0613-5},
}