Yiorgos Makris, Jamison Collins, Alex Orailoglu. How to avoid random walks in hierarchical test path identification. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 111-116, IEEE Computer Society, 2000. [doi]
@inproceedings{MakrisCO00-0,
title = {How to avoid random walks in hierarchical test path identification},
author = {Yiorgos Makris and Jamison Collins and Alex Orailoglu},
year = {2000},
doi = {10.1109/ETW.2000.873787},
url = {https://doi.org/10.1109/ETW.2000.873787},
researchr = {https://researchr.org/publication/MakrisCO00-0},
cites = {0},
citedby = {0},
pages = {111-116},
booktitle = {5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000},
publisher = {IEEE Computer Society},
isbn = {0-7695-0701-8},
}