Efficient Transparency Extraction and Utilization in Hierarchical Test - researchr publication authors

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Yiorgos Makris, Vishal Patel, Alex Orailoglu. Efficient Transparency Extraction and Utilization in Hierarchical Test. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 246-251, IEEE Computer Society, 2001. [doi]

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