A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment

Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner. A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment. J. Electronic Testing, 27(1):19-30, 2011. [doi]

Authors

Vezio Malandruccolo

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Mauro Ciappa

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Hubert Rothleitner

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Wolfgang Fichtner

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