Imane Malass, Wilfried Uhring, Jean-Pierre Le Normand, Norbert Dumas, Foudil Dadouche. A single photon avalanche detector in a 180 nm standard CMOS technology. In IEEE 13th International New Circuits and Systems Conference, NEWCAS 2015, Grenoble, France, June 7-10, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.