Automated Feature Localization for Hardware Designs using Coverage Metrics

Jan Malburg, Alexander Finder, Görschwin Fey. Automated Feature Localization for Hardware Designs using Coverage Metrics. In Jens Brandt, Klaus Schneider, editors, Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV), Kaiserslautern, Germany, March 5-7, 2012. pages 85-96, Verlag Dr. Kovac, 2012.

Abstract

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