Sushil K. Malik, E. F. Chace. MOS Gate Oxide Quality Control and Reliability Assessment by Voltage Ramping. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 384-389, IEEE Computer Society, 1984.
@inproceedings{MalikC84, title = {MOS Gate Oxide Quality Control and Reliability Assessment by Voltage Ramping}, author = {Sushil K. Malik and E. F. Chace}, year = {1984}, tags = {e-science, reliability}, researchr = {https://researchr.org/publication/MalikC84}, cites = {0}, citedby = {0}, pages = {384-389}, booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984}, publisher = {IEEE Computer Society}, }