Analog neural network design for RF built-in self-test - researchr publication authors

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Dzmitry Maliuk, Haralampos-G. D. Stratigopoulos, He Huang, Yiorgos Makris. Analog neural network design for RF built-in self-test. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 684-693, IEEE, 2010. [doi]

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