Wojciech Maly. New and Not-So-New Test Challenges of the Next Decade. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 11, IEEE Computer Society, 1996.
@inproceedings{Maly96:0,
title = {New and Not-So-New Test Challenges of the Next Decade},
author = {Wojciech Maly},
year = {1996},
tags = {testing},
researchr = {https://researchr.org/publication/Maly96%3A0},
cites = {0},
citedby = {0},
pages = {11},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}