Wojciech Maly, F. Joel Ferguson, John Paul Shen. Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 390-399, IEEE Computer Society, 1984.
@inproceedings{MalyFS84,
title = {Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells},
author = {Wojciech Maly and F. Joel Ferguson and John Paul Shen},
year = {1984},
tags = {analysis, systematic-approach},
researchr = {https://researchr.org/publication/MalyFS84},
cites = {0},
citedby = {0},
pages = {390-399},
booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984},
publisher = {IEEE Computer Society},
}