Uncertainty in multiple penetration depth fringing electric field sensor measurements

Alexander V. Mamishev, Shane R. Cantrell, Yanqing Du, Bernard C. Lesieutre, Markus Zahn. Uncertainty in multiple penetration depth fringing electric field sensor measurements. IEEE T. Instrumentation and Measurement, 51(6):1192-1199, 2002. [doi]

@article{MamishevCDLZ02,
  title = {Uncertainty in multiple penetration depth fringing electric field sensor measurements},
  author = {Alexander V. Mamishev and Shane R. Cantrell and Yanqing Du and Bernard C. Lesieutre and Markus Zahn},
  year = {2002},
  doi = {10.1109/TIM.2002.808013},
  url = {http://dx.doi.org/10.1109/TIM.2002.808013},
  tags = {C++},
  researchr = {https://researchr.org/publication/MamishevCDLZ02},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {51},
  number = {6},
  pages = {1192-1199},
}