A 2-bit highly scalable nonvolatile memory cell with two electrically isolated charge trapping sites

Tsz Yin Man, Mansun Chan. A 2-bit highly scalable nonvolatile memory cell with two electrically isolated charge trapping sites. Microelectronics Reliability, 45(2):349-354, 2005. [doi]

Authors

Tsz Yin Man

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Mansun Chan

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