A Bayesian approach to diagram matching with application to architectural models

David Mandelin, Doug Kimelman, Daniel M. Yellin. A Bayesian approach to diagram matching with application to architectural models. In Leon J. Osterweil, H. Dieter Rombach, Mary Lou Soffa, editors, 28th International Conference on Software Engineering (ICSE 2006), Shanghai, China, May 20-28, 2006. pages 222-231, ACM, 2006. [doi]

@inproceedings{MandelinKY06,
  title = {A Bayesian approach to diagram matching with application to architectural models},
  author = {David Mandelin and Doug Kimelman and Daniel M. Yellin},
  year = {2006},
  doi = {10.1145/1134317},
  url = {http://doi.acm.org/10.1145/1134317},
  tags = {architecture, systematic-approach},
  researchr = {https://researchr.org/publication/MandelinKY06},
  cites = {0},
  citedby = {0},
  pages = {222-231},
  booktitle = {28th International Conference on Software Engineering (ICSE 2006), Shanghai, China, May 20-28, 2006},
  editor = {Leon J. Osterweil and H. Dieter Rombach and Mary Lou Soffa},
  publisher = {ACM},
  isbn = {1-59593-375-1},
}