Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil. Application of supply current testing to analogue circuits, towards a structural analogue test methodology. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 51-56, IEEE Computer Society, 1999. [doi]
@inproceedings{ManhaeveVSC99,
title = {Application of supply current testing to analogue circuits, towards a structural analogue test methodology},
author = {Hans A. R. Manhaeve and Johan Verfaillie and B. Straka and J. P. Cornil},
year = {1999},
doi = {10.1109/ETW.1999.804221},
url = {https://doi.org/10.1109/ETW.1999.804221},
researchr = {https://researchr.org/publication/ManhaeveVSC99},
cites = {0},
citedby = {0},
pages = {51-56},
booktitle = {4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999},
publisher = {IEEE Computer Society},
isbn = {0-7695-0390-X},
}