Hans A. R. Manhaeve - researchr alias

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Viewing Publication 1 - 20 from 20

2020

On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCsGhazanfar Ali, Leila Bagheriye, Hans A. R. Manhaeve, Hans G. Kerkhoff. ats 2020: 1-6 [doi]

2015

Dependable Multicore Architectures at Nanoscale: The View From EuropeMarco Ottavi, Salvatore Pontarelli, Dimitris Gizopoulos, Cristiana Bolchini, Maria K. Michael, Lorena Anghel, Mehdi Baradaran Tahoori, Antonis M. Paschalis, Pedro Reviriego, Oliver Bringmann, Viacheslav Izosimov, Hans A. R. Manhaeve, Christos Strydis, Said Hamdioui. dt, 32(2):17-28, 2015. [doi]

2013

2008

The Quest for Test: Will Redundancy Cover All?Hans A. R. Manhaeve. ddecs 2008: 3 [doi]

Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and QualityB. Straka, Hans A. R. Manhaeve, J. Brenkus, Stefaan Kerckenaere. date 2008: 1310-1315 [doi]

2005

Current Testing for Nanotechnologies: A Demystifying Application Perspective.Hans A. R. Manhaeve. ats 2005: 456 [doi]

2004

Current testing for nanotechnologies: Myths, facts, and figuresHans A. R. Manhaeve. dt, 21(3):264, 2004.

2003

A practical evaluation of I/sub DDQ/ test strategies for deep submicron production test application. Experiences and targets from the fieldAlessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve. ets 2003: 65-70 [doi]

2002

A real world application used to implement a true IDDQ based test strategy (facts and figures)Hans A. R. Manhaeve, Joseph S. Vaccaro, Loren Benecke, David Prystasz. ets 2002: 81-86 [doi]

2001

An On-Chip Detection Circuit for the Verification of IC Supply ConnectionsHans A. R. Manhaeve, Stefaan Kerckenaere. dft 2001: 57-65 [doi]

2000

Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test MethodologyHans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil. et, 16(3):227-234, 2000. [doi]

1999

Application of supply current testing to analogue circuits, towards a structural analogue test methodologyHans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil. ets 1999: 51-56 [doi]

On-Chip Transient Current Monitor for Testing of Low Voltage CMOS ICViera Stopjaková, Hans A. R. Manhaeve, M. Sidiropulos. date 1999: 538-542 [doi]

1998

A Fully Digital Controlled Off-Chip IDDQ Measurement UnitB. Straka, Hans A. R. Manhaeve, Jozef Vanneuville, M. Svajda. date 1998: 495-500 [doi]

IOCIMU - An Integrated Off-Chip IDDQ Measurement UnitM. Svajda, B. Straka, Hans A. R. Manhaeve. date 1998: 959-960 [doi]

1997

CCII+ current conveyor based BIC monitor for I::DDQ:: testing of complex CMOS circuitsViera Stopjaková, Hans A. R. Manhaeve. date 1997: 266-270 [doi]

A monolithic off-chip IDDQ monitorM. Svajda, B. Straka, Hans A. R. Manhaeve. date 1997: 629 [doi]

1994

An Off-chip I::DDQ:: Current Measurement Unit for Telecommunication ASICsHans A. R. Manhaeve, Paul L. Wrighton, Jos van Sas, Urbain Swerts. itc 1994: 203-212

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