M. Svajda, B. Straka, Hans A. R. Manhaeve. IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit. In 1998 Design, Automation and Test in Europe (DATE 98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France. pages 959-960, IEEE Computer Society, 1998. [doi]
Abstract is missing.