M. Svajda, B. Straka, Hans A. R. Manhaeve. IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit. In 1998 Design, Automation and Test in Europe (DATE 98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France. pages 959-960, IEEE Computer Society, 1998. [doi]
@inproceedings{SvajdaSM98, title = {IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit}, author = {M. Svajda and B. Straka and Hans A. R. Manhaeve}, year = {1998}, url = {http://csdl.computer.org/comp/proceedings/date/1998/8359/00/83590959abs.htm}, researchr = {https://researchr.org/publication/SvajdaSM98}, cites = {0}, citedby = {0}, pages = {959-960}, booktitle = {1998 Design, Automation and Test in Europe (DATE 98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France}, publisher = {IEEE Computer Society}, }