Ghazanfar Ali, Leila Bagheriye, Hans A. R. Manhaeve, Hans G. Kerkhoff. On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.