Viera Stopjaková, Hans A. R. Manhaeve, M. Sidiropulos. On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC. In 1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany. pages 538-542, IEEE Computer Society, 1999. [doi]
Abstract is missing.