A Fully Digital Controlled Off-Chip IDDQ Measurement Unit

B. Straka, Hans A. R. Manhaeve, Jozef Vanneuville, M. Svajda. A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. In 1998 Design, Automation and Test in Europe (DATE 98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France. pages 495-500, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.