B. Straka, Hans A. R. Manhaeve, Jozef Vanneuville, M. Svajda. A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. In 1998 Design, Automation and Test in Europe (DATE 98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France. pages 495-500, IEEE Computer Society, 1998. [doi]
@inproceedings{StrakaMVS98,
title = {A Fully Digital Controlled Off-Chip IDDQ Measurement Unit},
author = {B. Straka and Hans A. R. Manhaeve and Jozef Vanneuville and M. Svajda},
year = {1998},
url = {http://csdl.computer.org/comp/proceedings/date/1998/8359/00/83590495abs.htm},
researchr = {https://researchr.org/publication/StrakaMVS98},
cites = {0},
citedby = {0},
pages = {495-500},
booktitle = {1998 Design, Automation and Test in Europe (DATE 98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France},
publisher = {IEEE Computer Society},
}