Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic. NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions. Microelectronics Reliability, 51(9-11):1540-1543, 2011. [doi]
@article{ManicDPDDGPS11,
title = {NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions},
author = {Ivica Manic and Danijel Dankovic and Aneta Prijic and Vojkan Davidovic and Snezana Djoric-Veljkovic and Snezana Golubovic and Zoran Prijic and Ninoslav Stojadinovic},
year = {2011},
doi = {10.1016/j.microrel.2011.06.004},
url = {http://dx.doi.org/10.1016/j.microrel.2011.06.004},
researchr = {https://researchr.org/publication/ManicDPDDGPS11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {9-11},
pages = {1540-1543},
}