Vojkan Davidovic - researchr alias

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Viewing Publication 1 - 8 from 8

2022

Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature StressSandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic. jcsc, 31(18), December 2022. [doi]

2018

2013

Nanoelectronic Devices, B.-G. Park, S.W. Hwang, Y.J. Park. Pan Stanford Publishing Pte. Ltd., Singapore (2012). 406 p., ISBN: 978-981-4364-00-3Vojkan Davidovic. mr, 53(12):2079, 2013. [doi]

2012

Reliability Physics and Engineering: Time-to-Failure Modeling, J.W. McPherson. Springer (2010). 318 pp., ISBN: 978-1-4419-6347-5Vojkan Davidovic. mr, 52(1):300, 2012. [doi]

2011

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditionsIvica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic. mr, 51(9-11):1540-1543, 2011. [doi]

2008

Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETsIvica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Ninoslav Stojadinovic. iet-cds, 2(2):213-221, 2008. [doi]

2004

Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistorsDimitrios N. Kouvatsos, Vojkan Davidovic, G. J. Papaioannou, Ninoslav Stojadinovic, L. Michalas, M. A. Exarchos, Apostolos T. Voutsas, D. Goustouridis. mr, 44(9-11):1631-1636, 2004. [doi]

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