Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Ninoslav Stojadinovic. Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs. IET Circuits, Devices & Systems, 2(2):213-221, 2008. [doi]
Abstract is missing.