Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic. NBTI and irradiation related degradation mechanisms in power VDMOS transistors. Microelectronics Reliability, 88:135-141, 2018. [doi]
Abstract is missing.