Advanced Path Delay Fault Testing Strategies in High-Performance Digital Circuits

Palanichamy Manikandan, Ramesh Patel, Sundar Gopalakrishnan, Karthikeyan Palaniswamy. Advanced Path Delay Fault Testing Strategies in High-Performance Digital Circuits. In IEEE East-West Design & Test Symposium, EWDTS 2024, Yerevan, Armenia, November 13-17, 2024. pages 1-5, IEEE, 2024. [doi]

Abstract

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