Transition count testing of CMOS combinational circuits

K. S. Manjunath, Damu Radharkrishnan. Transition count testing of CMOS combinational circuits. In First Great Lakes Symposium on VLSI, 1991, Kalamazoo, MI, USA, March 1-2, 1991. pages 110-114, IEEE, 1991. [doi]

Abstract

Abstract is missing.