Sdp gaps and ugc hardness for multiway cut, 0-extension, and metric labeling - researchr publication authors

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Rajsekar Manokaran, Joseph Naor, Prasad Raghavendra, Roy Schwartz. Sdp gaps and ugc hardness for multiway cut, 0-extension, and metric labeling. In Richard E. Ladner, Cynthia Dwork, editors, Proceedings of the 40th Annual ACM Symposium on Theory of Computing, Victoria, British Columbia, Canada, May 17-20, 2008. pages 11-20, ACM, 2008. [doi]

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