Sdp gaps and ugc hardness for multiway cut, 0-extension, and metric labeling

Rajsekar Manokaran, Joseph Naor, Prasad Raghavendra, Roy Schwartz. Sdp gaps and ugc hardness for multiway cut, 0-extension, and metric labeling. In Richard E. Ladner, Cynthia Dwork, editors, Proceedings of the 40th Annual ACM Symposium on Theory of Computing, Victoria, British Columbia, Canada, May 17-20, 2008. pages 11-20, ACM, 2008. [doi]

@inproceedings{ManokaranNRS08,
  title = {Sdp gaps and ugc hardness for multiway cut, 0-extension, and metric labeling},
  author = {Rajsekar Manokaran and Joseph Naor and Prasad Raghavendra and Roy Schwartz},
  year = {2008},
  doi = {10.1145/1374376.1374379},
  url = {http://doi.acm.org/10.1145/1374376.1374379},
  researchr = {https://researchr.org/publication/ManokaranNRS08},
  cites = {0},
  citedby = {0},
  pages = {11-20},
  booktitle = {Proceedings of the 40th Annual ACM Symposium on Theory of Computing, Victoria, British Columbia, Canada, May 17-20, 2008},
  editor = {Richard E. Ladner and Cynthia Dwork},
  publisher = {ACM},
  isbn = {978-1-60558-047-0},
}