Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs - researchr publication authors

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Andrea Manuzzato, Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Luca Sterpone, Massimo Violante. Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. In Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. pages 79-86, IEEE Computer Society, 2007. [doi]

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