Dot profile model-based direct binary search - researchr publication authors

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Yafei Mao, Utpal Sarkar, Isabel Borrell, Lluis Abello, Jan P. Allebach. Dot profile model-based direct binary search. In Color Imaging XXVIII: Displaying, Processing, Hardcopy, and Applications, San Francisco, CA, USA, January 15-19, 2023. Society for Imaging Science and Technology, 2023. [doi]

This author has not been identified. Look up 'Yafei Mao' in GoogleThis author has not been identified. Look up 'Utpal Sarkar' in GoogleThis author has not been identified. Look up 'Isabel Borrell' in GoogleThis author has not been identified. Look up 'Lluis Abello' in GoogleThis author has not been identified. Look up 'Jan P. Allebach' in Google

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