Yafei Mao, Utpal Sarkar, Isabel Borrell, Lluis Abello, Jan P. Allebach. Dot profile model-based direct binary search. In Color Imaging XXVIII: Displaying, Processing, Hardcopy, and Applications, San Francisco, CA, USA, January 15-19, 2023. Society for Imaging Science and Technology, 2023. [doi]
No references recorded for this publication.
No citations of this publication recorded.