Bo Mao, Jindong Zhou, Suzhen Wu, Hong Jiang 0001, Xiao Chen, Weijian Yang. Improving Flash Memory Performance and Reliability for Smartphones With I/O Deduplication. IEEE Trans. on CAD of Integrated Circuits and Systems, 38(6):1017-1027, 2019. [doi]
@article{MaoZWJCY19,
title = {Improving Flash Memory Performance and Reliability for Smartphones With I/O Deduplication},
author = {Bo Mao and Jindong Zhou and Suzhen Wu and Hong Jiang 0001 and Xiao Chen and Weijian Yang},
year = {2019},
doi = {10.1109/TCAD.2018.2834395},
url = {https://doi.org/10.1109/TCAD.2018.2834395},
researchr = {https://researchr.org/publication/MaoZWJCY19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {38},
number = {6},
pages = {1017-1027},
}