Linda Marchese, Pascal Bourqui, Sandra Turgeon, Bernd Harnisch, Martin Suess, François Châteauneuf, Alain Bergeron. Basis for optronic ScanSAR processing. In Claudia Notarnicola, Simonetta Paloscia, Nazzareno Pierdicca, editors, SAR Image Analysis, Modeling, and Techniques XI, SPIE Remote Sensing, Prague, Czech Republic, 19-22 September 2011. Volume 8179 of SPIE Proceedings, SPIE, 2011. [doi]
Abstract is missing.