Radu Marculescu. Worst-case analysis for pseudorandom testing. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 187-193, IEEE, 1993. [doi]
@inproceedings{Marculescu93, title = {Worst-case analysis for pseudorandom testing}, author = {Radu Marculescu}, year = {1993}, doi = {10.1109/VTEST.1993.313325}, url = {http://dx.doi.org/10.1109/VTEST.1993.313325}, researchr = {https://researchr.org/publication/Marculescu93}, cites = {0}, citedby = {0}, pages = {187-193}, booktitle = {11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA}, publisher = {IEEE}, isbn = {0-8186-3830-3}, }