Elie Maricau, Georges G. E. Gielen. Efficient reliability simulation of analog ICs including variability and time-varying stress. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1238-1241, IEEE, 2009. [doi]
@inproceedings{MaricauG09,
title = {Efficient reliability simulation of analog ICs including variability and time-varying stress},
author = {Elie Maricau and Georges G. E. Gielen},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090853&count=326&index=239},
tags = {e-science, reliability},
researchr = {https://researchr.org/publication/MaricauG09},
cites = {0},
citedby = {0},
pages = {1238-1241},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}