Elie Maricau, Georges G. E. Gielen. Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(12):1884-1893, 2010. [doi]
@article{MaricauG10-0,
title = {Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis},
author = {Elie Maricau and Georges G. E. Gielen},
year = {2010},
doi = {10.1109/TCAD.2010.2062870},
url = {http://dx.doi.org/10.1109/TCAD.2010.2062870},
tags = {analysis, e-science, context-aware, reliability},
researchr = {https://researchr.org/publication/MaricauG10-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {29},
number = {12},
pages = {1884-1893},
}