Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise - researchr publication

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M. Marin, Y. Akue Allogo, M. de Murcia, P. Llinares, J. C. Vildeuil. Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise. Microelectronics Reliability, 44(7):1077-1085, 2004. [doi]

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