Automatic Test Generation for Energy Consumption of Embedded Systems Modeled in EAST-ADL

Raluca Marinescu, Eduard Paul Enoiu, Cristina Seceleanu, Daniel Sundmark. Automatic Test Generation for Energy Consumption of Embedded Systems Modeled in EAST-ADL. In 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017. pages 69-76, IEEE Computer Society, 2017. [doi]

Abstract

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