Erik Jan Marinissen. Creating options for 3D-SIC testing. In 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013. pages 1-7, IEEE, 2013. [doi]
@inproceedings{Marinissen13-1,
title = {Creating options for 3D-SIC testing},
author = {Erik Jan Marinissen},
year = {2013},
doi = {10.1109/VLDI-DAT.2013.6533800},
url = {http://dx.doi.org/10.1109/VLDI-DAT.2013.6533800},
researchr = {https://researchr.org/publication/Marinissen13-1},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4435-7},
}