Erik Jan Marinissen, Betty Prince, Doris Keitel-Schulz, Yervant Zorian. Challenges in Embedded Memory Design and Test. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 722-727, IEEE Computer Society, 2005. [doi]
@inproceedings{MarinissenPKZ05,
title = {Challenges in Embedded Memory Design and Test},
author = {Erik Jan Marinissen and Betty Prince and Doris Keitel-Schulz and Yervant Zorian},
year = {2005},
doi = {10.1109/DATE.2005.92},
url = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.92},
tags = {testing, design},
researchr = {https://researchr.org/publication/MarinissenPKZ05},
cites = {0},
citedby = {0},
pages = {722-727},
booktitle = {2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany},
publisher = {IEEE Computer Society},
isbn = {0-7695-2288-2},
}