Temperature behavior of combination selection based mismatch calibration with 65 nm CMOS technology - researchr publication authors

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Joona Marku, Jonne Poikonen, Ari Paasio. Temperature behavior of combination selection based mismatch calibration with 65 nm CMOS technology. In Annual IEEE International SoC Conference, SoCC 2009, September 9-11, 2009, Belfast, Northern Ireland, UK, Proceedings. pages 311-314, IEEE, 2009. [doi]

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