Cleiton Magano Marques, Cristina Meinhardt, Paulo Francisco Butzen. Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions. J. Electronic Testing, 37(2):263-270, 2021. [doi]
@article{MarquesMB21,
title = {Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions},
author = {Cleiton Magano Marques and Cristina Meinhardt and Paulo Francisco Butzen},
year = {2021},
doi = {10.1007/s10836-021-05944-2},
url = {https://doi.org/10.1007/s10836-021-05944-2},
researchr = {https://researchr.org/publication/MarquesMB21},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {37},
number = {2},
pages = {263-270},
}